TEM Analysis Services

TEM Analysis (Transmission Electron Microscopy)

Our TEM Analysis service provides ultra-high-resolution imaging and advanced structural characterization at the atomic and nanoscale. Using cutting-edge Transmission Electron Microscopy, we deliver detailed insights into crystal structure, grain boundaries, lattice fringes, defects, nanoparticle morphology, and internal microstructure of materials. TEM enables visualization down to sub-nanometer features and, when combined with SAED, EDS, and HRTEM capabilities, offers comprehensive information on phase identification, elemental distribution, crystallinity, and structural integrity. This makes TEM essential for nanotechnology, materials science, semiconductor research, pharmaceuticals, metallurgy, and high-level academic investigations—supporting failure analysis, R&D, and innovation with unmatched precision.

Key Highlights

• Atomic to nanoscale imaging with sub-nanometer resolution

• HRTEM (High-Resolution TEM) for lattice structure and fringes

• SAED (Selected Area Electron Diffraction) for phase/crystal identification

• STEM & EDS/EDX for elemental mapping and compositional analysis

• Nanoparticle size, shape, and internal structure characterization

• Analysis of defects, dislocations, grain boundaries, and interfaces

• Polycrystalline, amorphous, and crystalline material evaluation

• Publication-ready micrographs and detailed analytical reports